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Hard X-ray photoelectron spectroscopy on buried, off-stoichiometric CoxMnyGez (x : z = 2 : 0.38) Heusler thin films

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons126789

Ouardi,  S.
Siham Ouardi, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons126599

Fecher,  G. H.
Gerhard Fecher, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons126564

Chadov,  S.
Stanislav Chadov, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons126601

Felser,  C.
Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Citation

Ouardi, S., Fecher, G. H., Chadov, S., Balke, B., Kozina, X., Felser, C., et al. (2013). Hard X-ray photoelectron spectroscopy on buried, off-stoichiometric CoxMnyGez (x: z = 2: 0.38) Heusler thin films. Applied Physics A, 111(2), 395-405. doi:10.1007/s00339-013-7565-y.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-1F98-4
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