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Magneto-optical characterization of single crystalline Co2FeAl0.4Si0.6 thin films on MgO(100) substrates with Cr and MgO seed layers

MPG-Autoren
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Felser,  C.
Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Zitation

Ruiz-Calaforra, A., Conca, A., Graf, T., Casper, F., Leven, B., Felser, C., et al. (2013). Magneto-optical characterization of single crystalline Co2FeAl0.4Si0.6 thin films on MgO(100) substrates with Cr and MgO seed layers. Journal of Physics D - Applied Physics, 46(47): 475001, pp. 475001-1-475001-5. doi:10.1088/0022-3727/46/47/475001.


Zitierlink: https://hdl.handle.net/11858/00-001M-0000-0015-1E1A-6
Zusammenfassung
We report on the experimental investigation of the influence of a seed layer on the magnetic properties of the full-Heusler alloy Co2FeAl0.4Si0.6 (CFAS). The studied magnetic films are grown epitaxially on MgO (1 0 0) substrates with Cr and/or MgO seed layers. By employing magneto-optical Kerr effect magnetometry we show that magnetic anisotropy can be tuned by choosing the proper seed layer. The results on CFAS show an overall uniaxial anisotropy plus a biaxial contribution which depends on the seed layer. In addition, if grown on MgO, a sharp increase in the coercive field H-C at a series of angles symmetric with respect to the easy axis is present. Scanning Kerr-microscope imaging is performed during the magnetization reversal process in order to reveal the type of magnetic domain formation taking place at these angles.