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Influence of line defects on the electrical properties of single crystal TiO2

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75666

Kelsch,  M.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Adepalli, K. K., Kelsch, M., Merkle, R., & Maier, J. (2013). Influence of line defects on the electrical properties of single crystal TiO2. Advanced Functional Materials, 23(14), 1798-1806. doi:10.1002adfm.201202256.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-0FA5-1
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