English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

STM Luminescence Spectroscopy of Intrinsic Defects in ZnO(0001̅)

MPS-Authors
/persons/resource/persons22134

Stavale,  Fernando
Chemical Physics, Fritz Haber Institute, Max Planck Society;
Centro Brasileiro de Pesquisas Fı́sicas - CBPF/MCTI;

/persons/resource/persons21916

Nilius,  Niklas
Chemical Physics, Fritz Haber Institute, Max Planck Society;
Institut für Physik, Carl von Ossietzky Universität Oldenburg;

/persons/resource/persons21524

Freund,  Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Stavale, F., Nilius, N., & Freund, H.-J. (2013). STM Luminescence Spectroscopy of Intrinsic Defects in ZnO(0001̅). The Journal of Physical Chemistry Letters, 4(22), 3972-3976. doi:10.1021/jz401823c.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0014-B3AD-C
Abstract
Luminescence spectroscopy with an STM is used to analyze the role of lattice defects in crystalline ZnO films grown on Au(111). The films exhibit a strong band-recombination peak at 373 nm as well as three maxima at higher wavelength, indicating the presence of oxide defects. To identify their nature, we systematically alter the preparation conditions by treating the films with UV radiation, hydrogen, and oxygen and at elevated temperature. From concomitant changes in the emission response, we are able to assign the subgap peaks to specific O and Zn defects in the wurtzite lattice. Our conclusions are discussed in light of recent DFT calculations.