Profiling structured beams using injected aerosols

Loh, N. D.; Starodub, Dmitri; Lomb, Lukas; Hampton, Christina Y.; Martin, Andrew V.; Sierra, Raymond G.; Barty, Anton; Aquila, Andrew; Schulz, Joachim; Steinbrener, Jan; Shoeman, Robert L.; Kassemeyer, Stephan; Bostedt, Christoph; Bozek, John; Epp, Sascha W.; Erk, Benjamin; Hartmann, Robert; Rolles, Daniel; Rudenko, Artem; Rudek, Benedikt; Foucar, Lutz; Kimmel, Nils; Weidenspointner, Georg; Hauser, Günther; Holl, Peter; Pedersoli, Emanuele; Liang, MengNing; Hunter, Mark S.; Gumprecht, Lars; Coppola, Nicola; Wunderer, Cornelia; Graafsman, Heinz; Maia, Filipe R. N. C.; Ekeberg, Tomas; Hantke, Max; Fleckenstein, Holger; Hirsemann, Helmut; Nass, Karol; White, Thomas A.; Tobias, Herbert J.; Farquar, George R.; Benner, W. Henry; Hau-Riege, Stefan; Reich, Christian; Hartmann, Andreas; Soltau, Heike; Marchesini, Stefano; Bajt, Sasa; Barthelmess, Miriam; Strueder, Lothar; Ullrich, Joachim; Bucksbaum, Philip; Hodgson, Keith O.; Frank, Mathias; Schlichting, Ilme; Chapman, Henry N.; Bogan, Michael J.

doi:doi:10.1117/12.930075

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Profiling structured beams using injected aerosols

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Ullrich, Joachim
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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引用

Loh, N. D., Starodub, D., Lomb, L., Hampton, C. Y., Martin, A. V., Sierra, R. G., Barty, A., Aquila, A., Schulz, J., Steinbrener, J., Shoeman, R. L., Kassemeyer, S., Bostedt, C., Bozek, J., Epp, S. W., Erk, B., Hartmann, R., Rolles, D., Rudenko, A., Rudek, B., Foucar, L., Kimmel, N., Weidenspointner, G., Hauser, G., Holl, P., Pedersoli, E., Liang, M., Hunter, M. S., Gumprecht, L., Coppola, N., Wunderer, C., Graafsman, H., Maia, F. R. N. C., Ekeberg, T., Hantke, M., Fleckenstein, H., Hirsemann, H., Nass, K., White, T. A., Tobias, H. J., Farquar, G. R., Benner, W. H., Hau-Riege, S., Reich, C., Hartmann, A., Soltau, H., Marchesini, S., Bajt, S., Barthelmess, M., Strueder, L., Ullrich, J., Bucksbaum, P., Hodgson, K. O., Frank, M., Schlichting, I., Chapman, H. N., & Bogan, M. J. (2012). Profiling structured beams using injected aerosols. In Proceedings of SPIE. SPIE © 1962 - 2013. All Rights Reserved. doi:doi:10.1117/12.930075.

引用: https://hdl.handle.net/11858/00-001M-0000-0014-736E-5

要旨

Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied. © (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.