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Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons101034

Jochum,  K. P.
Geochemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Kempenaers, L., Janssens, K., Jochum, K. P., Vincze, L., Vekemans, B., Somogyi, A., et al. (2003). Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF. Journal of Analytical Atomic Spectrometry, 18(4), 350-357.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0014-8F5C-0
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