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Macro Defect Inspection of TFT-LCD Color Filter Glass: System and Algorithm

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons84227

Son,  HI
Department Human Perception, Cognition and Action, Max Planck Institute for Biological Cybernetics, Max Planck Society;

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Son, H., Kim HW, Lee, H., & Jeong, D. (2005). Macro Defect Inspection of TFT-LCD Color Filter Glass: System and Algorithm. In EOS Conference on Industrial Imaging and Machine Vision (pp. 129-130). Hannover, Germany: European Optical Society.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0013-D561-F
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