Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates 
fabricated by atomic layer deposition and focused ion beam milling

Mayer, M.; Keskinbora, K.; Grévent, C.; Szeghalmi, A.; Knez, M.; Weigand, M.; Snigirev, A.; Snigereva, I.; Schütz, G.

doi:10.1107/S0909049513006602

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Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling

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Mayer, M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Keskinbora, K.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Grévent, C.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Weigand, M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schütz, G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Mayer, M., Keskinbora, K., Grévent, C., Szeghalmi, A., Knez, M., Weigand, M., et al. (2013). Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling. Journal of Synchrotron Radiation, 20, 433-440. doi:10.1107/S0909049513006602.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000E-F5BF-E

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