A dose-rate effect in single-particle electron microscopy

Chen, James Z.; Sachse, Carsten; Xu, Chen; Mielke, Thorsten; Spahn, Christian M. T.; Grigorieff, Nikolaus

doi:10.1016/j.jsb.2007.09.017

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A dose-rate effect in single-particle electron microscopy

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Mielke, Thorsten
Imaging/Electron Microscopy (Head: Rudi Lurz/Thorsten Mielke), Scientific Service (Head: Manuela B. Urban), Max Planck Institute for Molecular Genetics, Max Planck Society;

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Spahn, Christian M. T.
Dept. of Vertebrate Genomics (Head: Hans Lehrach), Max Planck Institute for Molecular Genetics, Max Planck Society;

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Citation

Chen, J. Z., Sachse, C., Xu, C., Mielke, T., Spahn, C. M. T., & Grigorieff, N. (2008). A dose-rate effect in single-particle electron microscopy. Journal of Structural Biology, 161(1), 92-100. doi:10.1016/j.jsb.2007.09.017.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-80B5-4

Abstract

A low beam intensity, low electron dose imaging method has been developed for single-particle electron cryo-microscopy (cryo-EM). Experiments indicate that the new technique can reduce beam-induced specimen movement and secondary radiolytic effects, such as “bubbling”. The improvement in image quality, especially for multiple-exposure data collection, will help single-particle cryo-EM to reach higher resolution.