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Journal Article

Pindel: a pattern growth approach to detect break points of large deletions and medium sized insertions from paired-end short reads.

MPS-Authors

Schulz,  Marcel H.
Max Planck Society;

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2865.pdf
(Any fulltext), 544KB

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Citation

Ye, K., Schulz, M. H., Long, Q., Apweiler, R., & Ning, Z. (2009). Pindel: a pattern growth approach to detect break points of large deletions and medium sized insertions from paired-end short reads. Bioinformatics, 25(21), 2865-2871. doi:10.1093/bioinformatics/btp394.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-7D68-D
Abstract
Motivation: There is a strong demand in the genomic community to develop effective algorithms to reliably identify genomic variants. Indel detection using next-gen data is difficult and identification of long structural variations is extremely challenging. Results: We present Pindel, a pattern growth approach, to detect breakpoints of large deletions and medium-sized insertions from paired-end short reads. We use both simulated reads and real data to demonstrate the efficiency of the computer program and accuracy of the results.