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High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76262

Wang,  Z.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75630

Jeurgens,  L. P. H.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76256

Wang,  J. Y.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

Phillipp,  F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75858

Mittemeijer,  E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Citation

Wang, Z., Jeurgens, L. P. H., Wang, J. Y., Phillipp, F., & Mittemeijer, E. J. (2009). High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si. Journal of Materials Research, 24(11), 3294-3299. doi:10.1557/JMR.2009.0404.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-7615-0
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