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X-ray/atomic force microscopy study of the temperature-dependent multilayer structure of PTCDI-C8 films on SiO2

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75715

Krauss,  T. N.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75252

Barrena,  E.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75397

de Oteyza,  D. G.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

Zhang,  X. N.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75815

Major,  J.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75415

Dosch,  H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Institut für Theoretische und Angewandte Physik, Pfaffenwaldring 57, 70550 Stuttgart, Germany;Institut für Organische Chemie, Am Hubland, Universität Würzburg, 97074 Würzburg, Germany;

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Citation

Krauss, T. N., Barrena, E., de Oteyza, D. G., Zhang, X. N., Major, J., Dehm, V., et al. (2009). X-ray/atomic force microscopy study of the temperature-dependent multilayer structure of PTCDI-C8 films on SiO2. Journal of Physical Chemistry C, 113(11), 4502-4506. doi:10.1021/jp808037w.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-75E3-6
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