Scanning microscopy by mid-infrared near-field scattering

Knoll, B.; Keilmann, F.

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Scanning microscopy by mid-infrared near-field scattering

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Knoll, B., & Keilmann, F. (1998). Scanning microscopy by mid-infrared near-field scattering. Applied Physics A (Materials Science Processing), 66(5), 477-481.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-721A-4

Abstract

We investigate mid-infrared imaging of dielectric and metallic surfaces by an ''apertureless'' SNOM approach of scattering CO2-laser radiation from an AFM tip. In the microscopic images we find and identify a new type of AFM-induced artifact (crosstalk via the tapping amplitude). Minimizing this by proper scan parameters we obtain evidence of true infrared contrast. The results demonstrate the material-sensitive potential of infrared-spectroscopic imaging and a spatial resolving power of better than 100 nm. [References: 12]