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Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy

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Knoll, B., & Keilmann, F. (2000). Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy. Optics Communications, 182(4-6), 321-328.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-717F-A
Abstract
Ovid-processing week 38/00