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Enhanced atomic corrugation in dynamic force microscopy - The role of repulsive forces

MPG-Autoren
http://pubman.mpdl.mpg.de/cone/persons/resource/persons21803

Lichtenstein,  Leonid
Chemical Physics, Fritz Haber Institute, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons21408

Büchner,  Christin
Chemical Physics, Fritz Haber Institute, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons32663

Stuckenholz,  Stefanie
Chemical Physics, Fritz Haber Institute, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons21628

Heyde,  Markus
Chemical Physics, Fritz Haber Institute, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons21524

Freund,  Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Volltexte (frei zugänglich)

1.3696039.pdf
(Verlagsversion), 2MB

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Zitation

Lichtenstein, L., Büchner, C., Stuckenholz, S., Heyde, M., & Freund, H.-J. (2012). Enhanced atomic corrugation in dynamic force microscopy - The role of repulsive forces. Applied Physics Letters, 100(12): 123105. doi:10.1063/1.3696039.


Zitierlink: http://hdl.handle.net/11858/00-001M-0000-0010-50DA-F
Zusammenfassung
Full range two dimensional (2D) force mapping was performed by means of low temperature dynamic force microscopy (DFM) on a highly complex surface structure. For this purpose, we used a thin film of vitreous silica on a Ru(0001)-support, which is a 2D structural equivalent to silica glass. The 2D spectroscopy shows that the contrast generating shift in vertical distance between two sites on the surface is twice as large on the repulsive branch of the frequency shift-distance curve as compared to the attractive branch. The results give insight into the origin of the formation of atomic resolution in DFM.