de.mpg.escidoc.pubman.appbase.FacesBean
English
 
Help Guide Disclaimer Contact us Login
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76143

Srot,  V.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76025

Salzberger,  U.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Srot, V., Watanabe, M., Scheu, C., van Aken, P. A., Salzberger, U., Luerßen, B., et al. (2010). Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy. Solid State Ionics, 181(35-36), 1616-1622. doi:10.1016/j.ssi.2010.08.026.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4FCB-7
Abstract
There is no abstract available