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Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy

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Srot,  V.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Salzberger,  U.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Srot, V., Watanabe, M., Scheu, C., van Aken, P. A., Salzberger, U., Luerßen, B., et al. (2010). Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy. Solid State Ionics, 181(35-36), 1616-1622. doi:10.1016/j.ssi.2010.08.026.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4FCB-7
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