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Quantitative X-ray diffraction analysis and modeling of the crystallization process in amorphous Si-B-C-N polymer derived ceramics

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76188

Tavakoli,  A. H.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75497

Gerstel,  P.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75504

Golczewski,  J. A.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Tavakoli, A. H., Gerstel, P., Golczewski, J. A., & Bill, J. (2010). Quantitative X-ray diffraction analysis and modeling of the crystallization process in amorphous Si-B-C-N polymer derived ceramics. Journal of the American Ceramic Society, 93, 1470-1478. doi:10.1111/j.1551-2916.2009.03591.x.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4F6B-1
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