Valence-band and chemical-state analyses of Zr and O in thermally grown thin 
zirconium-oxide films: an XPS study

Bakradze, G.; Jeurgens, L. P. H.; Mittemeijer, E. J.

doi:10.1021/jp206896m

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Valence-band and chemical-state analyses of Zr and O in thermally grown thin zirconium-oxide films: an XPS study

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Bakradze, G.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Jeurgens, L. P. H.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Mittemeijer, E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Bakradze, G., Jeurgens, L. P. H., & Mittemeijer, E. J. (2011). Valence-band and chemical-state analyses of Zr and O in thermally grown thin zirconium-oxide films: an XPS study. The Journal of Physical Chemistry C, 115, 19841-19848. doi:10.1021/jp206896m.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4EB6-E

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