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Note: Unique characterization possibilities in the ultra high vacuum scanning transmission x-ray microscope (UHV-STXM) "MAXYMUS" using a rotatable permanent magnetic field up to 0.22 T

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75899

Nolle,  D.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76272

Weigand,  M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75232

Audehm,  P.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75502

Goering,  E.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

Wolter,  C.
Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76085

Schütz,  G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Nolle, D., Weigand, M., Audehm, P., Goering, E., Wiesemann, U., Wolter, C., et al. (2012). Note: Unique characterization possibilities in the ultra high vacuum scanning transmission x-ray microscope (UHV-STXM) "MAXYMUS" using a rotatable permanent magnetic field up to 0.22 T. Review of Scientific Instruments, 83(4): 046112. doi:10.1063/1.4707747.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4B32-E
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