Measuring projected potential profiles across interfaces by reconstructing the 
exit face wave function from through focal series images

Bhattacharyya, S.; Koch, C. T.; Rühle, M.

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Measuring projected potential profiles across interfaces by reconstructing the exit face wave function from through focal series images

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Koch, C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle, M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Bhattacharyya, S., Koch, C. T., & Rühle, M. (2006). Measuring projected potential profiles across interfaces by reconstructing the exit face wave function from through focal series images. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 1138-1138). International Federation of Societies in Microscopy.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-4894-6

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