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Conference Paper

EELS and EDX study of Pt/YSZ interfaces

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76143

Srot,  V.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76113

Sigle,  W.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Srot, V., Scheu, C., Tchernychova, E., Sigle, W., Fischer, H., Janek, J., et al. (2006). EELS and EDX study of Pt/YSZ interfaces. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 1321-1321). International Federation of Societies in Microscopy.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4882-E
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