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Electron-loss near-edge structure analysis of precipitates in Yttria-doped alumina

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sturm, S., Gülgün, M., Cannon, R. M., & Rühle, M. (2006). Electron-loss near-edge structure analysis of precipitates in Yttria-doped alumina. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 1414-1414). International Federation of Societies in Microscopy.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4815-6
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