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Conference Paper

Determination of projected potential profiles across interfaces using through focal series reconstruction

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Koch,  C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Bhattacharyya, S., Koch, C. T., & Rühle, M. (2006). Determination of projected potential profiles across interfaces using through focal series reconstruction. Microscopy and Microanalysis, 12(Suppl. 2: Proceedings), 1016-1017.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-47EB-C
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