de.mpg.escidoc.pubman.appbase.FacesBean
English
 
Help Guide Disclaimer Contact us Login
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Aspects regarding measurement of thickness of intergranular glassy films

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75282

Bhattacharyya,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76177

Subramaniam,  A.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75691

Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Bhattacharyya, S., Subramaniam, A., Koch, C. T., & Rühle, M. (2006). Aspects regarding measurement of thickness of intergranular glassy films. Journal of Microscopy, 221, 46-62.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-46B9-4
Abstract
There is no abstract available