de.mpg.escidoc.pubman.appbase.FacesBean
English
 
Help Guide Disclaimer Contact us Login
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Measuring electrostatic potential profiles across amorphous intergranular films by electron diffraction

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75691

Koch,  C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Koch, C. T., Bhattacharyya, S., Rühle, M., Satet, R., & Hoffmann, M. J. (2006). Measuring electrostatic potential profiles across amorphous intergranular films by electron diffraction. Microscopy and Microanalysis, 12, 160-169.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-46B5-C
Abstract
There is no abstract available