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Measuring electrostatic potential profiles across amorphous intergranular films by electron diffraction

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Koch,  C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch, C. T., Bhattacharyya, S., Rühle, M., Satet, R., & Hoffmann, M. J. (2006). Measuring electrostatic potential profiles across amorphous intergranular films by electron diffraction. Microscopy and Microanalysis, 12, 160-169.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-46B5-C
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