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Examination of structural properties of interfaces by electron diffraction

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75691

Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch, C. T. (2006). Examination of structural properties of interfaces by electron diffraction. Materials Science and Engineering A, 422, 41-50.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-46B1-3
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