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Journal Article

Length-scale-controlled fatigue mechanisms in thin copper films

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76320

Zhang,  G. P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76232

Volkert,  C. A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76086

Schwaiger,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76282

Wellner,  P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75228

Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Citation

Zhang, G. P., Volkert, C. A., Schwaiger, R., Wellner, P., & Arzt, E. (2006). Length-scale-controlled fatigue mechanisms in thin copper films. Acta Materialia, 54, 3127-3139.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-45E6-6
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