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Texture transition in Cu thin films: electron backscatter diffraction vs. X-ray diffraction

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76132

Sonnweber-Ribic,  P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75533

Gruber,  P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75388

Dehm,  G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75228

Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Citation

Sonnweber-Ribic, P., Gruber, P., Dehm, G., & Arzt, E. (2006). Texture transition in Cu thin films: electron backscatter diffraction vs. X-ray diffraction. Acta Materialia, 54, 3863-3870.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-45AE-8
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