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SESAM: Exploring the frontiers of electron microscopy

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75691

Koch,  C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76113

Sigle,  W.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75607

Höschen,  R.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Emeriti, MPI for Nuclear Physics, Max Planck Society;

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Citation

Koch, C. T., Sigle, W., Höschen, R., Rühle, M., Essers, E., Benner, G., et al. (2006). SESAM: Exploring the frontiers of electron microscopy. Microscopy and Microanalysis, 12(6), 506-514.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4511-4
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