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Conference Paper

Mapping grain boundary potentials by inline electron holography

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75691

Koch,  C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75971

Rahmati,  B.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Koch, C. T., Rahmati, B., van Aken, P. A., Rühle, M., Bäurer, M., & Hoffmann, M. (2007). Mapping grain boundary potentials by inline electron holography. Microscopy & Microanalysis, 13(Suppl. 3), 334-335.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4438-5
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