EELS investigations of reference niobium oxides and anodically grown niobium 
oxide layers

Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Sigle, W.

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EELS investigations of reference niobium oxides and anodically grown niobium oxide layers

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Sigle, W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Bach, D., Störmer, H., Schneider, R., Gerthsen, D., & Sigle, W. (2007). EELS investigations of reference niobium oxides and anodically grown niobium oxide layers. In M. Marko, J. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, et al. (Eds.), Microscopy and Microanalysis 2007 (pp. 1274CD-1275CD). New York, USA: Cambridge University Press.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-43BB-9

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