de.mpg.escidoc.pubman.appbase.FacesBean
English
 
Help Guide Disclaimer Contact us Login
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

EELS investigations of reference niobium oxides and anodically grown niobium oxide layers

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76113

Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Bach, D., Störmer, H., Schneider, R., Gerthsen, D., & Sigle, W. (2007). EELS investigations of reference niobium oxides and anodically grown niobium oxide layers. In M. Marko, J. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, et al. (Eds.), Microscopy and Microanalysis 2007 (pp. 1274CD-1275CD). New York, USA: Cambridge University Press.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-43BB-9
Abstract
There is no abstract available