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The sub-electron-volt-sub-Angstrom-microscope (SESAM): Pushing the limits in monochromated and energy-filtered TEM

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75691

Koch,  C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76113

Sigle,  W.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75607

Höschen,  R.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

van Aken, P. A., Koch, C. T., Sigle, W., Höschen, R., Rühle, M., Essers, E., et al. (2007). The sub-electron-volt-sub-Angstrom-microscope (SESAM): Pushing the limits in monochromated and energy-filtered TEM. In M. Marko, J. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, et al. (Eds.), Microscopy and Microanalysis 2007 (pp. 862CD-863CD). New York, USA: Cambridge University Press.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-43B5-6
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