Analysis of results from X-ray magnetic reflectometry for magnetic multilayer 
systems

Fähnle, M.; Steiauf, D.; Martosiswoyo, L.; Goering, E.; Brück, S.; Schütz, G.

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Analysis of results from X-ray magnetic reflectometry for magnetic multilayer systems

MPS-Authors

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Fähnle, M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Steiauf, D.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Martosiswoyo, L.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Goering, E.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Brück, S.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schütz, G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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引用

Fähnle, M., Steiauf, D., Martosiswoyo, L., Goering, E., Brück, S., & Schütz, G. (2007). Analysis of results from X-ray magnetic reflectometry for magnetic multilayer systems. Physical Review B, 75:.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-4351-4

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