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In-situ atomic resolution HVEM studies of strontium titanate at high temperatures

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75946

Phillipp,  F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75271

Bellina,  P. J.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Phillipp, F., Bellina, P. J., Lee, S. B., Messer, R., & van Aken, P. A. (2008). In-situ atomic resolution HVEM studies of strontium titanate at high temperatures. Korean Journal of Microscopy, 38(4, Supplement), 102-103.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4156-E
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