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Grain-boundary plane orientation dependence of electrical barriers at Σ5 boundaries in SrTiO3

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75759

Lee,  S. B.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76113

Sigle,  W.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75946

Phillipp,  F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Lee, S. B., Lee, J.-H., Cho, Y.-H., Kim, D.-Y., Sigle, W., Phillipp, F., et al. (2008). Grain-boundary plane orientation dependence of electrical barriers at Σ5 boundaries in SrTiO3. Acta Materialia, 56, 4993-4997.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-413A-0
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