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Analytical TEM investigations of Pt/YSZ interfaces

MPS-Authors
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Srot,  V.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Srot, V., Watanabe, M., Scheu, C., van Aken, P. A., Mutoro, E., Janek, J., et al. (2008). Analytical TEM investigations of Pt/YSZ interfaces. In S. Richter, & A. Schwedt (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science (pp. 369-370). Berlin [et al.]: Springer.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-40FC-4
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