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Conference Paper

Low-loss-energy EFTEM imaging of triangular silver nanoparticles

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75886

Nelayah,  J.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75535

Gu,  L.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76113

Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75691

Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Nelayah, J., Gu, L., Sigle, W., Koch, C. T., Pastoriza-Santos, L., Liz-Marzan, L. M., et al. (2008). Low-loss-energy EFTEM imaging of triangular silver nanoparticles. In S. Richter, & A. Schwedt (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science (pp. 243-244). Berlin [et al.: Springer.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-40FA-8
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