Software precession electron diffraction

Koch, C. T.; Bellina, P.; van Aken, P. A.

doi:10.1007/978-3-540-85226-1_101

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Software precession electron diffraction

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Koch, C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

Bellina, P.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken, P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch, C. T., Bellina, P., & van Aken, P. A. (2008). Software precession electron diffraction. In M. Luysberg, K. Tillmann, & T. Weirich (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods (pp. 201-202). Berlin [et al.]: Springer.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-40EA-C

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