de.mpg.escidoc.pubman.appbase.FacesBean
English
 
Help Guide Disclaimer Contact us Login
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

Quantitative local strain analysis of Si/SiGe heterostructures using HRTEM

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75912

Özdöl,  V. B.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75946

Phillipp,  F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Özdöl, V. B., Phillipp, F., Kasper, E., & van Aken, P. A. (2008). Quantitative local strain analysis of Si/SiGe heterostructures using HRTEM. In M. Luysberg, K. Tillmann, & T. Weirich (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods (pp. 141-142). Berlin [et al.]: Springer.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-40E8-0
Abstract
There is no abstract available