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Focused ion beam preparation of atome probe specimens containing a single crystallographically well-defined grain boundary

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75789

López,  G. A.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75858

Mittemeijer,  E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Citation

Perez-Willard, F., Wolde-Giorgis, D., Al-Kassab, T., López, G. A., Mittemeijer, E. J., Kirchheim, R., et al. (2008). Focused ion beam preparation of atome probe specimens containing a single crystallographically well-defined grain boundary. Micron, 39, 45-52.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-40A5-4
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