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Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0110] orientation

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Du, K., & Rühle, M. (2008). Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0110] orientation. Journal of Microscopy, 232(1), 137-144. doi:10.1111/j.1365-2818.2008.02073.x.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3FB3-D
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