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Novel perspectives for the application of total internal reflection microscopy

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76233

Volpe,  G.
Max Planck Fellow Group Soft Matter, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75319

Brettschneider,  T.
Max Planck Fellow Group Soft Matter, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75263

Bechinger,  C.
Max Planck Fellow Group Soft Matter, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Volpe, G., Brettschneider, T., Helden, L., & Bechinger, C. (2009). Novel perspectives for the application of total internal reflection microscopy. Optics Express, 17(26), 23975-23985. doi:10.1364/OE.17.023975.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3EAC-7
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