Mapping of valence energy losses via energy-filtered annular dark-field 
scanning transmission electron microscopy

Gu, L.; Sigle, W.; Koch, C. T.; Nelayah, J.; Srot, V.; van Aken, P. A.

doi:10.1016/j.ultramic.2009.05.001

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Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy

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Gu, L.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sigle, W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch, C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Nelayah, J.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Srot, V.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken, P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Gu, L., Sigle, W., Koch, C. T., Nelayah, J., Srot, V., & van Aken, P. A. (2009). Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy. Ultramicroscopy, 109, 1164-1170. doi:10.1016/j.ultramic.2009.05.001.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3E34-2

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