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Investigation of single-crystalline nano-whiskers by different TEM-methods

MPS-Authors
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Richter,  G.
Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hillerich,  K.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Kelsch,  M.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hahn,  K.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Lang,  D.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Richter, G., Hillerich, K., Kelsch, M., Hahn, K., & Lang, D. (2009). Investigation of single-crystalline nano-whiskers by different TEM-methods. In W. Grogger, F. Hofer, & P. Pölt (Eds.), MC2009. Vol. 3: Materials Science (pp. 99-100). Graz: Verlag der Technischen Universität Graz, Austria.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3E29-B
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