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Various transmission electron microscopic techniques to characterize phase separation – illustrated using a LaF3 containing aluminosilicate glass

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75282

Bhattacharyya,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75551

Hahn,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Bhattacharyya, S., Höche, T., Hahn, K., & van Aken, P. A. (2009). Various transmission electron microscopic techniques to characterize phase separation – illustrated using a LaF3 containing aluminosilicate glass. Journal of Non-Crystalline Solids, 355, 393-396. doi:10.1016/j.jnoncrysol.2008.12.005.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3DAC-F
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