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Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75691

Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75745

Küstner,  V.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Abou-Ras, D., Koch, C. T., Küstner, V., van Aken, P. A., Jahn, U., Contreras, M. A., et al. (2009). Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties. Thin Solid Films, 517, 2545-2549. doi:10.1016/j.tsf.2008.11.044.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3D5E-E
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