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Interfacial microstructure and defect analysis in Cu(In,Ga)Se([sub]2)-based multilayered film by analytical transmission electron microscopy and focused ion beam

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76328

Zhang,  Z.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76249

Wagner,  T.
Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Zhang, Z., & Wagner, T. (2009). Interfacial microstructure and defect analysis in Cu(In,Ga)Se([sub]2)-based multilayered film by analytical transmission electron microscopy and focused ion beam. Thin Solid Films, 517(15), 4329-4335. doi:10.1016/j.tsf.2009.02.130.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3D0D-4
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