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Evidence for a layer-dependent Ehrlich-Schwöbel barrier in organic thin film growth

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76326

Zhang,  X .N.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75252

Barrena,  E.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75514

Goswami,  D.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75397

de Oteyza,  D. G.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76277

Weis,  C.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75415

Dosch,  H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

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Citation

Zhang, X.., Barrena, E., Goswami, D., de Oteyza, D. G., Weis, C., & Dosch, H. (2009). Evidence for a layer-dependent Ehrlich-Schwöbel barrier in organic thin film growth. Physical Review Letters, 103: 136101. doi:10.1103/PhysRevLett.103.136101.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3C95-5
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