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In-situ x-ray diffraction investigations during diffusion anneals of Ni-Cu thin film diffusion couples.

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76107

Sheng,  J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76284

Welzel,  U.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75858

Mittemeijer,  E.J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Citation

Sheng, J., Welzel, U., & Mittemeijer, E. (2010). In-situ x-ray diffraction investigations during diffusion anneals of Ni-Cu thin film diffusion couples. Advanced Materials Research, 89-1, 503-508. doi:10.4028/www.scientific.net/AMR.89-91.503.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3BD8-8
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