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Characterization of ytterbium silicide formed in ultra high vacuum

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Srot,  V.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Phillipp,  F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Łaszcz, A., Ratajczak, J., Czerwinski, A., Kątcki, J., Srot, V., Phillipp, F., et al. (2010). Characterization of ytterbium silicide formed in ultra high vacuum. Journal of Physics: Conference Series, 209: 012056.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3B75-4
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