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Characterization of ytterbium silicide formed in ultra high vacuum

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76143

Srot,  V.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75946

Phillipp,  F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Łaszcz, A., Ratajczak, J., Czerwinski, A., Kątcki, J., Srot, V., Phillipp, F., et al. (2010). Characterization of ytterbium silicide formed in ultra high vacuum. Journal of Physics: Conference Series, 209: 012056.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3B75-4
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